High resolution deep level transient spectroscopy (Laplace DLTS)
Electrical characterization of deep level defects in semiconductors.
General instrument information
Short name
Laplace DLTS
Inventory number
TBC
Category
nekategorizirana oprema
Instrument type
spektrometar
Analysis type
spektroskopska analiza
Standalone or bound
samostalan
Disciplines
Fizika
, Elektrotehnika
Year of manufacture
2017
External link
Location
Room
I krilo/102