Raman spectrometer integrated with atomic force microscope

Raman-AFM (Raman spectrometer integrated with atomic force microscope) is an instrument allowing simultaneous acquisition of Raman spectra and atomic force microscope images of molecular/atomic structureson the surface, as well as measuring forces between them and the probe tip. Besides contact and intermittent mode, it can measure photocurrent and perform Kelvin probe measurements. Next to semiconductors and organic solid state samples, it is especially useful in studying coatings nad solar cell materials, and nanostructures in general. Expected applications are in phyrmaceutics, microplastics detection, and characterization of advanced materials. This is the only instrument in Croatia of this kind.

General instrument information

Short name

Raman-AFM

Inventory number

50997

Characteristics

Model

alpha 300 RA

Manufacturer

Witec

Operating and measuring scope

530 nm - 1100 nm spectral interval of Raman spectrometer, AFM stage has working area 100 microns x 100 microns, 20 microns in z direction

Detailed technical characteristics

Raman spectrometer has three gratings with 300, 600 and 1800 grooves per mm, two lasera: 532 i 785 nm, objectives 10x, 50x and 100x; ANDOR CCD low dark-current CCD thermoelectrically cooled to -60 C; AFM with piezo stage having resolution 0.3 nm in x-y and 0.2 nm in z direction, contact mode, intermittent mode, current to voltage amplifier FEMTO DLPCA-200 for measurements of photoconductivity and Kelvin probe measurements.

Purchase price

365000 EUR

Portability

Remote work

Terms of use

User instructions

only authorised personnel tained by Witec

Usage method

korištenje uz pomoć ovlaštene osobe