In this project, ion beam analysis (IBA) methods used to determine the 2D distribution of elements, such as particle-induced X-ray emission (PIXE) and Rutherford elastic backscattering (RBS), will be sequentially linked to MeV-SIMS, which provides information on the molecular composition of the sample, in order to obtain complete, correlated information on elemental and molecular composition. Exploring the possibility of correlated determination of spatial molecular and elemental distribution has recently been the focus of interest of numerous research groups around the world, in various fields ranging from biomedicine to forensics and cultural heritage preservation. In biomedicine, elemental and molecular markers play an important role in understanding and monitoring disease progression. The detection of biomarkers in tissues can lead to better development of new therapies and drugs. The combination of surface sensitive MeV SIMS technique and PIXE method that provides information from deeper layers of the sample, can reveal the sequence of deposition of writing tools on documents that are the subject of forensic investigations. There are currently no methods in forensics that can do this reliably. The characterisation and classification of organic and inorganic components in painting materials and paintings can also help to determine the origin of a work of art and its restoration. The advantages of sequential elemental and molecular mapping are numerous and subject of investigation in this project. In order to be able to map sample surfaces that are not contaminated by various contaminants, it is planned to install an ion source for cleaning and sputtering. Also, damage cross sections will be measured to assess the level of sample damage during the measurement. Also, for various types of organic samples, the optimal ion beam for sequential MeV SIMS-PIXE measurements will be determined.